J. Kierzek, P. Przetakiewicz
Institute of Nnuclear Chemistry and Technology, Dorodna 16, 03-195 Warsaw, Poland
An analytical procedure for determination of La, Ce, Pr and Nd has been developed. The EDXRF method has
been applied by using 241Am source for excitation of the characteristic K-lines radiation of the elements.
A correction formula is proposed for the samples with matrix heavier than those used for calibration.
The detection limits and accuracy of the analytical procedure using reference materials have been estimated.