F. Riesz1, A. L. Toth1, L. Ryć2, W. Słysz3, M. Węgrzecki3
1 Hungarian Academy of Sciences, Research Institute for Technical Physics and Materials Science, P.O. Box 49, H-1525 Budapest, Hungary,
2 Institute of Plasma Physics and Laser Microfusion, P.O. Box 49, 00-908 Warsaw, Poland,
3 Institute of Electron Technology, Al. Lotnikow 32/46, 02-668 Warsaw, Poland
The electron-beam-induced current (EBIC) method is employed to study the boundary effects of the commercial BPYP and BPYP 42 photodiodes, aiming at a better understanding of their response to a-particle and light-pulse excitation. Our results show that the EBIC method is suitable for the assessment of photodetectors for X-ray detector applications. The sensitivities of different detector areas are quantitatively assessed. A good agreement is found with pulse-height spectra measurements. The complementary nature of electron-beam and light-pulsed/a-particle excitation is pointed out.