Since the installation of PF-DENA at AEOI about one year ago, we performed quantitative studies of variation of X-ray radiations from a new Filippov-type Plasma Focus device: Dena (90 kJ, 25 kV, 288 mF). The operating gas was neon at a constant low pressure of 1 torr and different pressures of krypton admixture (up to 0.3 torr), with the discharge voltage up to 18 kV. For a charging voltage of 17 kV with 41 kJ stored energy and spark gap pressure of 1.2´10^-2 torr, the maximum soft and little hard X-ray (SXR-HXR) emission is found for the neon, resulting in a total SXR yield of 2 V/shot measured by silicon semiconductor diode detectors. Concerning the effect of krypton admixture, a maximum intensity of SXR radiation has been observed at low krypton pressure that is about 1 V/shot. At higher pressure, the quantity of the SXR emission decreases down to zero. However, the maximum intensity of the HXR radiation yield in the same pressure range was found to be 2.5 V/shot. By increasing the pressure of krypton up to 0.3 torr, the results show that the krypton admixture gas generally causes, a decrease of the SXR radiation yield down to zero, whereas, the HXR emission yield carries a maximum value at the optimum pressure of krypton that is about 0.1 torr. Nevertheless, the pressure increments of krypton admixture lead to decreasing in the discharge valtage for the maximum X-ray production.